Total Oxide X-Ray Analysis

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Application Note

  • Published: May 11, 2012
  • Author: Thermo Scientific
  • Copyright: Thermo Fisher Scientific
  • Suppliers: Thermo Fisher Scientific
  • Products: X-ray
  • Channels: X-ray Spectrometry

There are many techniques for elemental analysis. However, none are as flexible in analytical range and material type as X-ray fluorescence. Wavelength dispersive X-ray fluorescence (WDXRF) allows measurement of up to 83 elements of the periodic table in samples of various forms and nature: solids or liquids, conductive or nonconductive. Other advantages of XRF over other techniques are speed of analysis, generally easy sample preparation, very good stability, precision and wide dynamic range (from ppm levels to 100 %).

The two largest factors in analysis accuracy and precision in WDXRF are accuracy of standards and sample preparation. Standard accuracies are typically derived by performing multiple analyses on a material by several different laboratories. The most common form of this type of analysis is done using round robin testing. A statistical computation of all results is performed to achieve a certified reference value for the measured elements. These materials are commercially available via many government agencies

Read the full Application Note - AN41666 (PDF: 522 KB)

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