Quantitative analysis of Mo–Si–B alloy phases with wavelength dispersive spectroscopy (WDS–SEM)

Skip to Navigation

EarlyView Article

  • Published: Dec 21, 2017
  • Author: P.M. Kellner, H. Dijkstra, U. Glatzel
  • Journal: X-Ray Spectrometry

Mo–Si–B alloys show great potential as high temperature materials. Due to peak overlapping of B‐Kα and Mo‐Mζ, analyzing these alloys with microanalysis presents a real challenge. This paper describes the analytical methodology used to qualify and quantify the boron content in these alloys without stoichiometric reference samples by the use of a single parallel‐beam wavelength dispersive spectrometer. Characterization of boron is performed by using a coupled energy dispersive X‐ray spectroscopy—wavelength dispersive spectroscopy system in a scanning electron microscope. Self‐made pure element samples are used for calibration and quantification of the boron content.

Social Links

Share This Links

Bookmark and Share

Microsites

Suppliers Selection
Societies Selection

Banner Ad

Click here to see
all job opportunities

Most Viewed

Copyright Information

Interested in spectroscopy? Visit our sister site spectroscopyNOW.com

Copyright © 2018 John Wiley & Sons, Inc. All Rights Reserved